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CHEN.5410 Nanomaterials Characterization II (Formerly 10.541)

Id: 002924 Credits Min: 3 Credits Max: 3

Description

This hands-on laboratory course will cover the practical aspects of light, electron and scanned probe microscopy techniques discussed in Nanomaterials Characterization I (10.540). A variety of nanomaterials samples systems will be characterized using laser scanning confocal microscopy (LSCM), scanning electron microscopy (SEM), transmission electron microscopy (TEM) and atomic force microscopy (AFM). The laboratory experiments will provide practical experience in sample preparation techniques, optimization of instrumental conditions for imaging and spectroscopy, and data analysis and interpretation. Students will work on individual term projects involving real-world samples that are of interest to them, and use the techniques they learned in the course to characterize their samples.

Prerequisites

CHEN.5370 Nanomaterials Characterization I

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