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  • Atomic Force Microscopy (AFM)
  • Laser Scanning Confocal Microscopy (LSCM)
  • Scanning Electron Microscopy (SEM)
  • Transmission Electron Microscopy (TEM)

Surface Analysis

  • Optical Profilometry
  • X-ray Photoelectron Spectroscopy (XPS)
  • Surface Force Apparatus (SFA)

Mass Spectrometry

  • Matrix Assisted Laser Desorption-Ionization Time of Flight Mass spectrometry (MALDI-TOF MS)


  • Dip-Pen Nanolithography (DPN)
  • E-Beam Nanolithography

Physical Property Determination

  • Porosimetry
  • Oxygen Permeation Analyzer (OPA)

Sample Preparation Equipment

  • Ultra Microtomy
  • Ion Milling
  • Cutting/Polishing/Grinding
  • Dimpling
  • Sample Coating
  • Sample Drying