Joel Therrien, Ph.D.
Expertise: High speed AFM, specialized cantilevers for scanning probe microscopy, nanoelectronic devices, and graphene synthesis.
B.S. Physics, University of MA Lowell
M.S. in Energy Engineering, University of MA Lowell
Ph.D. Physics, University of Illinois at Urbana-Champaign
Metrology of nanoscale objects; development of high speed atomic force microscopy and scanning tuneling microscopy. Nanomaterial based devices; quantum dot photodetectors and cantilever sensors for chemical and biological sensing. Materials synthesis and testing; graphene growth and assessment of materials for hydrogen storage.
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