Refereed Publications '96-'02 : Advanced Electronics Technology Center : UMass Lowell

1996-2002

S. Mil'shtein, D. Kharas, C. Lee, and P. Ersland, "Secondary Electrons Imaging of MESFET Operation," J. Vac. Sci. Technol., B 14 (1), 1996

S. Mil'shtein, "Beam Testing of Electrical Field in Semiconductor Devices," Microelect. Eng., 31, 3-12, 1996

S. Mil'shtein, J. Therrien, "Impact of etching on doping profiles in CZ silicon photo-diodes," Mat. Sic. & Eng., B41., 386-388, 1996

S. Mil’shtein, D. Kharas, J. Therrien, A.Chin, F. Dabkowski, “Operation of Quantum Well Laser Monitored by Electron Microscope,” Phys. Semic., 4, 3199-3202, World Scientific, 1996

J. Therrien, S. Mil’shtein, A.Chin, “Measurement of Quasi-Fermi Levels in Quantum Well Lasers,” Thin Films Structure & Morphology, 749-754, 1996

S. Mil’shtein, J. Therrien. “Method of Testing of Semiconductor Devices.” Patent # 5,945,833, from November 1997

S. Mil’shtein, V. Kaper, A. Rasner. “Precise Cutting of Crystalline Samples.” Patent application from August 1997

S.Mil’shtein,S.Nabokin.“Tri-State Logic on Multigate Transistors.”Patent application from August 1997

S. Mil'shtein, "Measurement of Quasi-Fermi Energies by Scanning Electron Beam,"Lett. Applied Physics, 71, .10, 1406-1409, 1997

S. Mil’shtein, J. Therrien, E. Thurkins, A. Chin, F. Dabkowsky, “Assessment of Current and Optical Confinement in Operational Quantum Well Laser,” Microelect. Engineering, 43-44, 539-543, 1998

S. Mil’shtein, S. Nabokin, S. Sui. “Tailored Field in Multigate FET’s.” Patent # 6,037,830, from May 1998

S. Mil'shtein, J.Therrien, A.Chin, and J.Zarrabi., "Nonequilibrium Diagrams of a Single Quantum Well Laser," Superlat. & Microstr., 23, 5, 1063-1066, 1998

J. Therrien and S.Mil’shtein, "Improvement to Differential Voltage Contrast and Light and Electron Scanning Beam Analysis of Solar Cells," Scann. 20, 104-105, 1998

D.J.Leahy, J.M.Mooney, M.N.Alexander, M.M.Chi, and S. Mil'shtein, "Rapid, Large Area Mapping of Defect Concentration in Semiconductor Wafers by Infrared Absorption," IR. Phys. & Technology, 39, 83-88, 1998

S. Mil’shtein, J. Therrien, “Emission Failures of Single Quantum Well Lasers,” [ISBN 981-02-4030-9]) 0860.pdf, pages 1-4, 1999

S. Mil’shtein, “Dislocations in Microelectronics,” Phys. Stat. Solid., (a) 171, 371-376, 1999

S. Mil’shtein and C. LaBraque. “Optical Device for Loose Alignment in Biometric Applications," Patent # 60,150,494 from January 2000

S. Mil’shtein, “Semiconductor Devices from Inside,” Scanning, 22, 227-233, (2000)

S. Mil’shtein, “Cutting Cartridge," Patent # 60,183,424 from February 2000

S. Mil’shtein, W. Teynor, T. Deloge, B. Paquin, Y. Tran, R. Snoonian. “Solar-Electric Powered Lawnmower with Electronic Minimization of Energy.” Patent # 60,185,082 February 2000

S. Mil’shtein and J. Therrien. “ Method for Reliable Correlation of Images Images in Biometric Applications," Patent # 60,262,093 from June 2000

S. Mil’shtein, Jason Pinsonnault and C. LaBraque. “Adjustable Holder for Contactless Fingerprint and/or Palm Registration,"Patent # 60,264,879 from January 2000

S. Mil'shtein, E. Thurkins, N.Meritt, K. Novaris, J. Therrien, "Sectional Voltage Contrast Topography of Quantum Well Diodes," Scanning, 20, 2000

S. Mil’shtein, D. Joy. “Microanalysis Using Secondary Electrons in SEM," Scanning, 23, 5, 295-297, 38, 2001

S. Mil’shtein, S. Sui, “Study of 2DEG in MOSFET with Tailored Field," Proc. 25th Int.Conf.Phys. Semicond. 1755, 2001

S. Mil’shtein, “New Method to Minimize Hot Electron Damage in MOSFETs," Proc. 25th Int.Conf.Phys. Semicond. 1767, 2001

S. Mil’shtein, “Direct Assessment of Recombination Noise in Semiconductors Using Electron Beam Induced Conductivity," Scanning, 23, 2, 118-119, 2001

S. Mil’shtein, B. Kimball, R. Knowles, K. Novaris, P. Ersland,“Practical Aspects of Microanalysis Using Secondary Electrons in Scanning Electron Microscopy," Scanning, 23, 2, 94-95, 2001

S. Mil’shtein, C. Gil,“Transistor with Buried Source.” Patent # 60,302,476 from July 2001

S. Mil’shtein, P. Ersland, C. Gil, ”Scrambler Using Tri-Gate MESFET.” Patent application from July 2001

S.Mil’shtein, P. Ersland, Y. Young, “Method of Fabrication of Transistor with Buried Source.” Patent application from July 2001

S. Mil'shtein, "Dislocation Induced Noise in Semiconductors," Solid Stat. Phys, July 2002

S. Mil’shtein, C. Palludi, “RF Testing of MESFET with Tailored Field,"Proc. 26th Int. Conf. Phys. Semicond. 1811, 2002

S. Mil’shtein, P. Ersland and C. Gil, “Reliability Test of MESFETs in Presence Of Hot Electrons," IEEE, IRPS, 40, 230-234, 2002

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