Facilities

Microscopy

• Atomic Force Microscopy (AFM)
• Laser Scanning Confocal Microscopy (LSCM)
• Scanning Electron Microscopy (SEM)
• Transmission Electron Microscopy (TEM)

Surface Analysis

• Optical Profilometry
• X-ray Photoelectron Spectroscopy (XPS)
• Surface Force Apparatus (SFA)

Mass Spectrometry

• Matrix Assisted Laser Desorption-Ionization Time of Flight Mass spectrometry (MALDI-TOF MS)

Nano-Lithography

• Dip-Pen Nanolithography (DPN)
• E-Beam Nanolithography

Physical Property Determination

• Porosimetry
• Oxygen Permeation Analyzer (OPA)

Sample Preparation Equipment

• Ultra Microtomy
• Ion Milling
• Cutting/Polishing/Grinding
• Dimpling
• Sample Coating
• Sample Drying