Material Characterization Laboratory (MCL)

Microscopy

Atomic Force Microscopy (AFM)
Veeco NanoScope IIIa
PSIA XE-150

Laser Scanning Confocal Microscopy (LSCM)
Olympus FV300

Scanning Electron Microscopy (SEM)
Amray 1400 SEM
JEOL JSM-1401F FE-SEM

Transmission Electron Microscopy (TEM)
Philips EM400 TEM
Topcon 002B HR-TEM