Microscopy Laboratory

The Center for Advanced Materials utilizes SEM's, TEM and surface probe microscopies at the university's Materials Characterization Laboratory.

Atomic Force Microscopes (AFM): Park XE-100, XE-150 
Scanning Electron Microscopes (SEM): FESEM JEOL JSM 7401F 
Transmission Electron Microscope (TEM): Philips EM-400 
High Resolution TEM: TOPCON 002B 
Focused Ion Beam and Cryo SEM: Auriga, Carl Zeiss