Center for Advanced Materials - Facilities & Laboratories

Microscopy Laboratory

The Center for Advanced Materials utilizes SEM's, TEM and surface probe microscopies at the University's Materials Characterization Laboratories.

Atomic Force Microscopes (AFM): Park XE-100, XE-150


Scanning Electron Microscopes (SEM): FESEM JEOL JSM 7401F


Transmission Electron Microscope (TEM): Philips EM-400


High Resolution TEM: TOPCON 002B

Focused Ion Beam and Cryo SEM: Auriga, Carl Zeiss