Publications

Refereed Publications

1996-2002

  • S. Mil'shtein, D. Kharas, C. Lee, and P. Ersland, "Secondary Electrons Imaging of MESFET Operation," J. Vac. Sci. Technol., B 14 (1), 1996
  • S. Mil'shtein, "Beam Testing of Electrical Field in Semiconductor Devices," Microelect. Eng., 31, 3-12, 1996
  • S. Mil'shtein, J. Therrien, "Impact of etching on doping profiles in CZ silicon photo-diodes," Mat. Sic. & Eng., B41., 386-388, 1996
  • S. Mil’shtein, D. Kharas, J. Therrien, A.Chin, F. Dabkowski, “Operation of Quantum Well Laser Monitored by Electron Microscope,” Phys. Semic., 4, 3199-3202, World Scientific, 1996
  • J. Therrien, S. Mil’shtein, A.Chin, “Measurement of Quasi-Fermi Levels in Quantum Well Lasers,” Thin Films Structure & Morphology, 749-754, 1996
  • S. Mil’shtein, J. Therrien. “Method of Testing of Semiconductor Devices.” Patent # 5,945,833, from November 1997
  • S. Mil’shtein, V. Kaper, A. Rasner. “Precise Cutting of Crystalline Samples.” Patent application from August 1997
  • S.Mil’shtein,S.Nabokin.“Tri-State Logic on Multigate Transistors.”Patent application from August 1997
  • S. Mil'shtein, "Measurement of Quasi-Fermi Energies by Scanning Electron Beam,"Lett. Applied Physics, 71, .10, 1406-1409, 1997
  • S. Mil’shtein, J. Therrien, E. Thurkins, A. Chin, F. Dabkowsky, “Assessment of Current and Optical Confinement in Operational Quantum Well Laser,” Microelect. Engineering, 43-44, 539-543, 1998
  • S. Mil’shtein, S. Nabokin, S. Sui. “Tailored Field in Multigate FET’s.” Patent # 6,037,830, from May 1998
  • S. Mil'shtein, J.Therrien, A.Chin, and J.Zarrabi., "Nonequilibrium Diagrams of a Single Quantum Well Laser," Superlat. & Microstr., 23, 5, 1063-1066, 1998
  • J. Therrien and S.Mil’shtein, "Improvement to Differential Voltage Contrast and Light and Electron Scanning Beam Analysis of Solar Cells," Scann. 20, 104-105, 1998
  • D.J.Leahy, J.M.Mooney, M.N.Alexander, M.M.Chi, and S. Mil'shtein, "Rapid, Large Area Mapping of Defect Concentration in Semiconductor Wafers by Infrared Absorption," IR. Phys. & Technology, 39, 83-88, 1998
  • S. Mil’shtein, J. Therrien, “Emission Failures of Single Quantum Well Lasers,” [ISBN 981-02-4030-9]) 0860.pdf, pages 1-4, 1999
  • S. Mil’shtein, “Dislocations in Microelectronics,” Phys. Stat. Solid., (a) 171, 371-376, 1999
  • S. Mil’shtein and C. LaBraque. “Optical Device for Loose Alignment in Biometric Applications," Patent # 60,150,494 from January 2000
  • S. Mil’shtein, “Semiconductor Devices from Inside,” Scanning, 22, 227-233, (2000)
  • S. Mil’shtein, “Cutting Cartridge," Patent # 60,183,424 from February 2000
  • S. Mil’shtein, W. Teynor, T. Deloge, B. Paquin, Y. Tran, R. Snoonian. “Solar-Electric Powered Lawnmower with Electronic Minimization of Energy.” Patent # 60,185,082 February 2000
  • S. Mil’shtein and J. Therrien. “ Method for Reliable Correlation of Images Images in Biometric Applications," Patent # 60,262,093 from June 2000
  • S. Mil’shtein, Jason Pinsonnault and C. LaBraque. “Adjustable Holder for Contactless Fingerprint and/or Palm Registration,"Patent # 60,264,879 from January 2000
  • S. Mil'shtein, E. Thurkins, N.Meritt, K. Novaris, J. Therrien, "Sectional Voltage Contrast Topography of Quantum Well Diodes," Scanning, 20, 2000
  • S. Mil’shtein, D. Joy. “Microanalysis Using Secondary Electrons in SEM," Scanning, 23, 5, 295-297, 38, 2001
  • S. Mil’shtein, S. Sui, “Study of 2DEG in MOSFET with Tailored Field," Proc. 25th Int.Conf.Phys. Semicond. 1755, 2001
  • S. Mil’shtein, “New Method to Minimize Hot Electron Damage in MOSFETs," Proc. 25th Int.Conf.Phys. Semicond. 1767, 2001
  • S. Mil’shtein, “Direct Assessment of Recombination Noise in Semiconductors Using Electron Beam Induced Conductivity," Scanning, 23, 2, 118-119, 2001
  • S. Mil’shtein, B. Kimball, R. Knowles, K. Novaris, P. Ersland,“Practical Aspects of Microanalysis Using Secondary Electrons in Scanning Electron Microscopy," Scanning, 23, 2, 94-95, 2001
  • S. Mil’shtein, C. Gil,“Transistor with Buried Source.” Patent # 60,302,476 from July 2001
  • S. Mil’shtein, P. Ersland, C. Gil, ”Scrambler Using Tri-Gate MESFET.” Patent application from July 2001
  • S.Mil’shtein, P. Ersland, Y. Young, “Method of Fabrication of Transistor with Buried Source.” Patent application from July 2001
  • S. Mil'shtein, "Dislocation Induced Noise in Semiconductors," Solid Stat. Phys, July 2002
  • S. Mil’shtein, C. Palludi, “RF Testing of MESFET with Tailored Field,"Proc. 26th Int. Conf. Phys. Semicond. 1811, 2002
  • S. Mil’shtein, P. Ersland and C. Gil, “Reliability Test of MESFETs in Presence Of Hot Electrons," IEEE, IRPS, 40, 230-234, 2002